mtd: rawnand: Use nanddev_mtd_max_bad_blocks()

nanddev_mtd_max_bad_blocks() is implemented by the generic NAND layer
and is already doing what we need. Reuse this function instead of
having our own implementation.

While at it, get rid of the ->max_bb_per_die and ->blocks_per_die
fields which are now unused.
Signed-off-by: Boris Brezillon <bbrezillon@kernel.org>
Signed-off-by: Miquel Raynal <miquel.raynal@bootlin.com>
Reviewed-by: Frieder Schrempf <frieder.schrempf@kontron.de>

drivers/mtd/nand/raw/nand_base.c

@@ -4297,42 +4297,6 @@ static int nand_block_markbad(struct mtd_info *mtd, loff_t ofs)
 	return nand_block_markbad_lowlevel(mtd_to_nand(mtd), ofs);
 }
 
-/**
- * nand_max_bad_blocks - [MTD Interface] Max number of bad blocks for an mtd
- * @mtd: MTD device structure
- * @ofs: offset relative to mtd start
- * @len: length of mtd
- */
-static int nand_max_bad_blocks(struct mtd_info *mtd, loff_t ofs, size_t len)
-{
-	struct nand_chip *chip = mtd_to_nand(mtd);
-	u32 part_start_block;
-	u32 part_end_block;
-	u32 part_start_die;
-	u32 part_end_die;
-
-	/*
-	 * max_bb_per_die and blocks_per_die used to determine
-	 * the maximum bad block count.
-	 */
-	if (!chip->max_bb_per_die || !chip->blocks_per_die)
-		return -ENOTSUPP;
-
-	/* Get the start and end of the partition in erase blocks. */
-	part_start_block = mtd_div_by_eb(ofs, mtd);
-	part_end_block = mtd_div_by_eb(len, mtd) + part_start_block - 1;
-
-	/* Get the start and end LUNs of the partition. */
-	part_start_die = part_start_block / chip->blocks_per_die;
-	part_end_die = part_end_block / chip->blocks_per_die;
-
-	/*
-	 * Look up the bad blocks per unit and multiply by the number of units
-	 * that the partition spans.
-	 */
-	return chip->max_bb_per_die * (part_end_die - part_start_die + 1);
-}
-
 /**
  * nand_suspend - [MTD Interface] Suspend the NAND flash
  * @mtd: MTD device structure
@@ -5819,7 +5783,7 @@ static int nand_scan_tail(struct nand_chip *chip)
 	mtd->_block_isreserved = nand_block_isreserved;
 	mtd->_block_isbad = nand_block_isbad;
 	mtd->_block_markbad = nand_block_markbad;
-	mtd->_max_bad_blocks = nand_max_bad_blocks;
+	mtd->_max_bad_blocks = nanddev_mtd_max_bad_blocks;
 
 	/*
 	 * Initialize bitflip_threshold to its default prior scan_bbt() call.

drivers/mtd/nand/raw/nand_onfi.c

@@ -251,9 +251,6 @@ int nand_onfi_detect(struct nand_chip *chip)
 	memorg->bits_per_cell = p->bits_per_cell;
 	chip->bits_per_cell = p->bits_per_cell;
 
-	chip->max_bb_per_die = le16_to_cpu(p->bb_per_lun);
-	chip->blocks_per_die = le32_to_cpu(p->blocks_per_lun);
-
 	if (le16_to_cpu(p->features) & ONFI_FEATURE_16_BIT_BUS)
 		chip->options |= NAND_BUSWIDTH_16;
 

include/linux/mtd/rawnand.h

@@ -1015,9 +1015,6 @@ struct nand_legacy {
  * @id:			[INTERN] holds NAND ID
  * @parameters:		[INTERN] holds generic parameters under an easily
  *			readable form.
- * @max_bb_per_die:	[INTERN] the max number of bad blocks each die of a
- *			this nand device will encounter their life times.
- * @blocks_per_die:	[INTERN] The number of PEBs in a die
  * @data_interface:	[INTERN] NAND interface timing information
  * @cur_cs:		currently selected target. -1 means no target selected,
  *			otherwise we should always have cur_cs >= 0 &&
@@ -1076,8 +1073,6 @@ struct nand_chip {
 
 	struct nand_id id;
 	struct nand_parameters parameters;
-	u16 max_bb_per_die;
-	u32 blocks_per_die;
 
 	struct nand_data_interface data_interface;