staging: iio: tsl2583: combine sysfs documentation

There are two separate files describing the tsl2583 sysfs attributes.
Combine the two files into one. Updated the name of the sysfs attributes
to match the current ABI.
Signed-off-by: Brian Masney <masneyb@onstation.org>
Suggested-by: Peter Meerwald-Stadler <pmeerw@pmeerw.net>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>

drivers/staging/iio/Documentation/light/sysfs-bus-iio-light-tsl2583

-What:		/sys/bus/iio/devices/device[n]/in_illuminance0_calibrate
+What:		/sys/bus/iio/devices/device[n]/in_illuminance_calibrate
 KernelVersion:	2.6.37
 Contact:	linux-iio@vger.kernel.org
 Description:
 		This property causes an internal calibration of the als gain trim
 		value which is later used in calculating illuminance in lux.
+
+What:		/sys/bus/iio/devices/device[n]/in_illuminance_lux_table
+KernelVersion:	2.6.37
+Contact:	linux-iio@vger.kernel.org
+Description:
+		This property gets/sets the table of coefficients
+		used in calculating illuminance in lux.
+
+What:		/sys/bus/iio/devices/device[n]/in_illuminance_input_target
+KernelVersion:	2.6.37
+Contact:	linux-iio@vger.kernel.org
+Description:
+		This property is the known externally illuminance (in lux).
+		It is used in the process of calibrating the device accuracy.

drivers/staging/iio/Documentation/sysfs-bus-iio-light-tsl2583

-What:		/sys/bus/iio/devices/device[n]/lux_table
-KernelVersion:	2.6.37
-Contact:	linux-iio@vger.kernel.org
-Description:
-		This property gets/sets the table of coefficients
-		used in calculating illuminance in lux.
-
-What:		/sys/bus/iio/devices/device[n]/illuminance0_calibrate
-KernelVersion:	2.6.37
-Contact:	linux-iio@vger.kernel.org
-Description:
-		This property causes an internal calibration of the als gain trim
-		value which is later used in calculating illuminance in lux.
-
-What:		/sys/bus/iio/devices/device[n]/illuminance0_input_target
-KernelVersion:	2.6.37
-Contact:	linux-iio@vger.kernel.org
-Description:
-		This property is the known externally illuminance (in lux).
-		It is used in the process of calibrating the device accuracy.