iio: adc: ad9467: add new chip_info variables
Add new variables to the per chip info structure: * test_points: Number of valid test points for calibration; * has_dco_invert: Supports inverting DCO (Data clock output) polarity; * dco_en: Specicic mask to enable DCO delays. This is in preparation for supporting new parts with subtle differences in how to configure the hardware. Note that with the new test_points variable, we also add a new calib_map_size to 'struct ad9467_state' so we know our map size depending on how many test points we have and if we can run the calibration in the inverted state or not. Signed-off-by: Nuno Sa <nuno.sa@analog.com> Link: https://patch.msgid.link/20240704-dev-iio-ad9467-new-devs-v1-2-f1adfee921f7@analog.comSigned-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
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