HW queues testing at driver load and after reset takes a substantial
amount of time.
This commit reduces the queues test time in Gaudi2 devices by running
all the tests in parallel instead of one after the other.
Time measurements on tests duration shows that the new method is almost
x100 faster than the serial approach.
Signed-off-by: Moti Haimovski <mhaimovski@habana.ai>
Reviewed-by: Oded Gabbay <ogabbay@kernel.org>
Signed-off-by: Oded Gabbay <ogabbay@kernel.org>